A one-day workshop on Edge AI, semiconductor device testing was held at Nagaland University’s Kohima campus on September 24.
KOHIMA, SEPTEMBER 26 (MExN): A one-day workshop on “Empowering the Next Generation of Edge AI Innovators” and “Semiconductor Device Characterisation & Test Validation” was held at Nagaland University’s Kohima campus on September 24.
The programme was jointly organised by the departments of IT, CSE and ECE under the School of Engineering and Technology (SET), NU.
The first session was conducted by Satish Mohanram, Senior Director and GM of SiMa.ai (India), who spoke on building and deploying Edge AI applications with SiMa.ai’s DevKit and Palette Edgematic software. He gave live demonstrations on Palette Software, Palette Edgematic and Modalix, and highlighted future opportunities in AI such as student research projects, faculty collaborations, startups and industry innovations.
The second session was led by Dr Boopesh Mahela, Application Expert from Tektronix, who briefed participants on test and measuring instruments from Tektronix and Keithley. He also discussed semiconductor device characterisation and test validation, stressing how high-precision instruments make device-to-wafer level testing accessible.
A live demonstration and hands-on session concluded the workshop, which was attended by scholars, faculty and students of NU-SET.
